Near-field scanning optical microscopy (NSOM) is a type of microscopy where a sub-wavelength light source is used as a scanning probe over a sample. This is a scanned probe technique where an image is obtained by raster scanning a probe across a surface collecting data at an array of points during the scan. In order to achieve an optical resolution better than the diffraction limit, the scanning probe has to be brought within the near-field region. The probe is scanned over a surface of the sample at a height above the surface of a few nanometers and allows optical imaging with spatial resolution beyond the diffraction limit.

This invention comprises a nanostructure conductor where the diameter of the inner conductor and diameter of the outer conductor are smaller than an optical signal wavelength. Furthermore a nanowire, which connects a light-emitting pixel on the top surface and a corresponding light-receiving pixel on the bottom surface of the film with an incorporated magnifying element, allows for an improved optical microscope. The probe then converts photons from an optical signal into an electric current through a photovoltaic effect and this system thereby facilitates sub-wavelength, sub-diffraction limits and spatial resolution.

File Number: 2006.009/nau