Scanning probe microscopy (SPM) forms images of surfaces using a physical probe that scans the specimen of interest. An image of the surface is obtained by mechanically moving the probe over the specimen, line by line, and recording the probe-surface interaction as a function of position. The resolution varies depending upon the technique used, but the present state of the art uses laser light directed at and reflected off the backside of a cantilever probe. As one decreases the cantilever size, which enhances resolution, optical detection becomes increasingly difficult, especially when the cantilever dimensions approach or become less than the wavelength of the light in the detector beam. The use of these cantilevers is a major factor in limiting SPM resolution. Micro-dimensional probes that are capable of detecting single proton and single electron spin are not possible using present cantilevers. This invention solves that problem by allowing detection of structures one nanometer in size.

File Number: 2002.006/nau and 2005.021/nau