Innovation

Contactless Probe for Band-Offset Metrology of Semiconductor Wafers at Dielectric Interfaces

Vanderbilt University
posted on 10/31/2008

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For more information, please contact:

lee.bridges@Vanderbilt.Edu

File Number: VU9940 


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Principal Investigator:

Ashok Choudhury Ashok Choudhury

Innovations (93)

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Ashok Choudhury Ashok Choudhury

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